Improving Combinational Circuit Resilience against Soft Errors via Selective Resource Allocation
2017 20TH IEEE INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUIT SYSTEMS (DDECS), Dresden, Germany, 19 - 21 April 2017, pp.12-15, (Full Text)
- Publication Type: Conference Paper / Full Text
- Doi Number: 10.1109/ddecs.2017.7934576
- City: Dresden
- Country: Germany
- Page Numbers: pp.12-15
- Hacettepe University Affiliated: Yes