Improving Combinational Circuit Resilience against Soft Errors via Selective Resource Allocation

YARAN T., TOSUN S.

2017 20TH IEEE INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUIT SYSTEMS (DDECS), Dresden, Germany, 19 - 21 April 2017, pp.12-15 identifier identifier

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1109/ddecs.2017.7934576
  • City: Dresden
  • Country: Germany
  • Page Numbers: pp.12-15
  • Hacettepe University Affiliated: Yes