GISAXS analysis of Ge nanoparticles embedded ZnO thin films: The effect of oxygen partial pressure and thermal process on the nanostructured aggregations


BAM B. , İDE S. , KEILBACH A., CEYLAN A.

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, cilt.71, ss.145-150, 2017 (SCI İndekslerine Giren Dergi) identifier identifier

  • Cilt numarası: 71
  • Basım Tarihi: 2017
  • Doi Numarası: 10.1016/j.mssp.2017.07.019
  • Dergi Adı: MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
  • Sayfa Sayıları: ss.145-150

Özet

Ge nanoparticles embedded in ZnO thin films (synthesized on p-type Si substrates) were investigated to explore their potential usage possibilities as diodes for opto-electronic devices and photovoltaics, thin-film transistors, and solar cells. Nano scale structural details under the effect of different gas pressure of O-2 may include some hints to understand and develop structure-property correlations of the focused type materials. With this purpose, GISAXS (Grazing-incidence small-angle X ray scattering) was used for 3D structural analysis of the films according to the thermal process (Rapid Thermal Annealing: RTA and Absence of Thermal Effect: AS-MADE) and O-2 partial pressure during the deposition of ZnO matrix.