Multi-parametric interferometric reflectance imaging sensor

Aslan M., Snekvik S., Seymour E., Gür S. D., Ergene E., Ünlü N. L., ...More

Scientific reports, vol.16, no.1, 2026 (SCI-Expanded, Scopus) identifier identifier

  • Publication Type: Article / Article
  • Volume: 16 Issue: 1
  • Publication Date: 2026
  • Doi Number: 10.1038/s41598-026-45282-x
  • Journal Name: Scientific reports
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus, BIOSIS, Chemical Abstracts Core, MEDLINE, Directory of Open Access Journals
  • Hacettepe University Affiliated: No

Abstract

We present a dual-wavelength, multi-parametric Interferometric Reflectance Imaging Sensor (MP-IRIS) for real-time, label free, multiplexed binding kinetic measurements without the "bulk-effect". Our platform dynamically tracks the conditions of the solution and corrects in real time, demonstrating a reduction in bulk effect to 3 pg/mm[Formula: see text] with bulk refractive index change of [Formula: see text] RIU. By incorporating multi-wavelength data acquisition, we improve the repeatability and reduce quantification error due to variation in chip manufacturing and surface treatment. Proof-of-concept DNA hybridization assays validate accurate, multiplexed binding measurements under diverse chip conditions. MP-IRIS retains the high sensitivity of prior IRIS designs, lowering the overall complexity of the system and offering potential applications in small-molecule analysis.