High temperature coefficient of resistance and low noise tungsten oxide doped amorphous vanadium oxide thin films for microbolometer applications

Celik O., DUMAN M.

THIN SOLID FILMS, cilt.691, 2019 (SCI İndekslerine Giren Dergi) identifier identifier


In this study, we report tungsten oxide (WO3) doped vanadium target in order to sputter amorphous vanadium tungsten oxide (a-VWOx) thin films by reactive direct-current magnetron sputtering technique. No post annealing and post oxidation steps were applied to improve bolometric properties. Thin films with high temperature coefficient of resistance, up to 3.02%/K, were prepared with resistivity range of 1-10 Omega cm thereby controlling the oxygen flow rate and sputtering conditions. Thin film composition was determined using X-ray photoelectron spectroscopy analysis which showed that the film has a mixed phase of V2O5, VO2 and V2O3. The noise level of the deposited film at 20 Hz was calculated as 1.9 x 10(-15) V-2/Hz from the noise spectrum density analysis. This noise level was found out to be comparable to the literature for VOx films deposited by ion beam deposition technique.