Bayesian (X)over-bar control limits for exponentially distributed measurements


Demirhan H. , Hamurkaroglu C.

JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION, cilt.84, sa.3, ss.628-643, 2014 (SCI İndekslerine Giren Dergi) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 84 Konu: 3
  • Basım Tarihi: 2014
  • Doi Numarası: 10.1080/00949655.2012.721884
  • Dergi Adı: JOURNAL OF STATISTICAL COMPUTATION AND SIMULATION
  • Sayfa Sayıları: ss.628-643

Özet

This article deals with the construction of an X control chart using the Bayesian perspective. We obtain new control limits for the X chart for exponentially distributed data-generating processes through the sequential use of Bayes' theorem and credible intervals. Construction of the control chart is illustrated using a simulated data example. The performance of the proposed, standard, tolerance interval, exponential cumulative sum (CUSUM) and exponential exponentially weighted moving average (EWMA) control limits are examined and compared via a Monte Carlo simulation study. The proposed Bayesian control limits are found to perform better than standard, tolerance interval, exponential EWMA and exponential CUSUM control limits for exponentially distributed processes.