Regional push-out bond strength and coronal microleakage of Resilon after different light-curing methods


Nagas E. , ÇEHRELİ Z. C. , Durmaz V., Vallittu P. K. , Lassila L. V. J.

JOURNAL OF ENDODONTICS, cilt.33, sa.12, ss.1464-1468, 2007 (SCI İndekslerine Giren Dergi) identifier identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 33 Konu: 12
  • Basım Tarihi: 2007
  • Doi Numarası: 10.1016/j.joen.2007.07.028
  • Dergi Adı: JOURNAL OF ENDODONTICS
  • Sayfa Sayıları: ss.1464-1468

Özet

The purpose of this study was to assess the push-out bond strength and coronal microleakage of the Epiphany (Pentron Clinical Technologies, Wallingford, CT) + Resilon (Resilon Research LLC, Madison, CT) obturation system with respect to different photoactivation methods used. Roots of human maxillary central incisors (n = 60) were prepared with 0.06 taper nickel-titanum rotary files to size 30. After application of the Epiphany sealer, the roots were obturated with Resilon cones. The specimens were randomly assigned into three groups (n = 10/group) according to the light-curing unit (LCU) used from the coronal aspect: (1) quartz-tungsten-halogen/40 seconds, (2) light-emitting diode/20 seconds, and (3) plasma arc/6 seconds. Thereafter, 2-mm thick horizontal sections (n = 3) were obtained from each specimen from the coronal to apical direction and subjected to push-out test at a cross-head-speed of 1mm/min. Failure modes were assessed quantitatively under a stereomicroscope and morphologically under a scanning electron microscope. The remaining 30 roots were used for the dye-leakage assessments. Both the type of LCU and the level of sectioning had significant effects on bond strength. The following statistical ranking was obtained for bond strength values: quartz-tungsten-halogen > light-emitting diode > plasma arc. Coronal microleakage of specimens cured with the plasma arc was significantly greater than those of other groups (p < 0.05).