W. Chen Et Al. , "Capacitance and S-Parameter Techniques for Dielectric Characterization With Application to High-k PMNT Thin-Film Layers," IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.59, no.6, pp.1723-1729, 2012
Chen, W. Et Al. 2012. Capacitance and S-Parameter Techniques for Dielectric Characterization With Application to High-k PMNT Thin-Film Layers. IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.59, no.6 , 1723-1729.
Chen, W., McCarthy, K. G., Mathewson, A., Copuroglu, M., O'Brien, S., & Winfield, R., (2012). Capacitance and S-Parameter Techniques for Dielectric Characterization With Application to High-k PMNT Thin-Film Layers. IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.59, no.6, 1723-1729.
Chen, Wenbin Et Al. "Capacitance and S-Parameter Techniques for Dielectric Characterization With Application to High-k PMNT Thin-Film Layers," IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.59, no.6, 1723-1729, 2012
Chen, Wenbin Et Al. "Capacitance and S-Parameter Techniques for Dielectric Characterization With Application to High-k PMNT Thin-Film Layers." IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.59, no.6, pp.1723-1729, 2012
Chen, W. Et Al. (2012) . "Capacitance and S-Parameter Techniques for Dielectric Characterization With Application to High-k PMNT Thin-Film Layers." IEEE TRANSACTIONS ON ELECTRON DEVICES , vol.59, no.6, pp.1723-1729.
@article{article, author={Wenbin Chen Et Al. }, title={Capacitance and S-Parameter Techniques for Dielectric Characterization With Application to High-k PMNT Thin-Film Layers}, journal={IEEE TRANSACTIONS ON ELECTRON DEVICES}, year=2012, pages={1723-1729} }