Eryilmaz, M. Et Al. 2022. Defect Classification from Electronic Card Images by Deep Learning Elektronik Kart Görüntülerinden Derin Öǧrenme ile Kusur Siniflandirmasi. 30th Signal Processing and Communications Applications Conference, SIU 2022 , (Safranbolu, Turkey).

Eryilmaz, M., Cil, M., Akturk, S., Tilegi, M., Tirak, H., YILMAZ, A., ... Yuksel, S. E.(2022). Defect Classification from Electronic Card Images by Deep Learning Elektronik Kart Görüntülerinden Derin Öǧrenme ile Kusur Siniflandirmasi . 30th Signal Processing and Communications Applications Conference, SIU 2022, Safranbolu, Turkey

Eryilmaz, MUSTAFA Et Al. "Defect Classification from Electronic Card Images by Deep Learning Elektronik Kart Görüntülerinden Derin Öǧrenme ile Kusur Siniflandirmasi," 30th Signal Processing and Communications Applications Conference, SIU 2022, Safranbolu, Turkey, 2022

Eryilmaz, MUSTAFA Et Al. "Defect Classification from Electronic Card Images by Deep Learning Elektronik Kart Görüntülerinden Derin Öǧrenme ile Kusur Siniflandirmasi." 30th Signal Processing and Communications Applications Conference, SIU 2022 , Safranbolu, Turkey, 2022

Eryilmaz, M. Et Al. (2022) . "Defect Classification from Electronic Card Images by Deep Learning Elektronik Kart Görüntülerinden Derin Öǧrenme ile Kusur Siniflandirmasi." 30th Signal Processing and Communications Applications Conference, SIU 2022 , Safranbolu, Turkey.

@conferencepaper{conferencepaper, author={MUSTAFA ERYILMAZ Et Al. }, title={Defect Classification from Electronic Card Images by Deep Learning Elektronik Kart Görüntülerinden Derin Öǧrenme ile Kusur Siniflandirmasi}, congress name={30th Signal Processing and Communications Applications Conference, SIU 2022}, city={Safranbolu}, country={Turkey}, year={2022}}