Atıf Formatları
Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution
  • IEEE
  • ACM
  • APA
  • Chicago
  • MLA
  • Harvard
  • BibTeX

O. Karci Et Al. , "Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution," REVIEW OF SCIENTIFIC INSTRUMENTS , vol.85, 2014

Karci, O. Et Al. 2014. Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution. REVIEW OF SCIENTIFIC INSTRUMENTS , vol.85 .

Karci, O., Dede, M., & ORAL, A., (2014). Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution. REVIEW OF SCIENTIFIC INSTRUMENTS , vol.85.

Karci, Ozgur, Munir Dede, And AHMET ORAL. "Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution," REVIEW OF SCIENTIFIC INSTRUMENTS , vol.85, 2014

Karci, Ozgur Et Al. "Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution." REVIEW OF SCIENTIFIC INSTRUMENTS , vol.85, 2014

Karci, O. Dede, M. And ORAL, A. (2014) . "Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution." REVIEW OF SCIENTIFIC INSTRUMENTS , vol.85.

@article{article, author={Ozgur Karci Et Al. }, title={Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution}, journal={REVIEW OF SCIENTIFIC INSTRUMENTS}, year=2014}