BACIOĞLU, A. Et Al. 2014. Single and multilayered a-SiOx:H (x < 1) thin film samples analyzed by optical absorption and small-angle X-ray scattering. MATERIALS CHEMISTRY AND PHYSICS , vol.146, no.3 , 425-430.

BACIOĞLU, A., KAZAN, U., & İDE, S., (2014). Single and multilayered a-SiOx:H (x < 1) thin film samples analyzed by optical absorption and small-angle X-ray scattering. MATERIALS CHEMISTRY AND PHYSICS , vol.146, no.3, 425-430.

BACIOĞLU, AKIN, Ural KAZAN, And SEMRA İDE. "Single and multilayered a-SiOx:H (x < 1) thin film samples analyzed by optical absorption and small-angle X-ray scattering," MATERIALS CHEMISTRY AND PHYSICS , vol.146, no.3, 425-430, 2014

BACIOĞLU, AKIN Et Al. "Single and multilayered a-SiOx:H (x < 1) thin film samples analyzed by optical absorption and small-angle X-ray scattering." MATERIALS CHEMISTRY AND PHYSICS , vol.146, no.3, pp.425-430, 2014

BACIOĞLU, A. KAZAN, U. And İDE, S. (2014) . "Single and multilayered a-SiOx:H (x < 1) thin film samples analyzed by optical absorption and small-angle X-ray scattering." MATERIALS CHEMISTRY AND PHYSICS , vol.146, no.3, pp.425-430.

@article{article, author={AKIN BACIOĞLU Et Al. }, title={Single and multilayered a-SiOx:H (x < 1) thin film samples analyzed by optical absorption and small-angle X-ray scattering}, journal={MATERIALS CHEMISTRY AND PHYSICS}, year=2014, pages={425-430} }